The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1993
Filed:
Jun. 24, 1991
Toshihiro Ishizuka, Katsuta, JP;
Munetaka Tsuda, Mito, JP;
Masao Yabusaki, Katsuta, JP;
Yasuo Wada, Katsuta, JP;
Takayuki Shimizu, Katsuta, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A quadrature detection device for magnetic resonance imaging includes a pair of probes each having a pair of first conductors with a vertical arm and wings formed at both ends of the vertical arm and guard rings disposed inside the wings to oppose them and predetermined capacitors. In each probe, the resonance characteristics of the probe has two peaks. Symmetry of the peak existing in the resonance frequency range is effected by spacing the peak existing in a frequency range other than the resonance frequency range apart from the former. Thus, uniformity of the resulting image can be improved. The drop of the Q value of the probe is prevented by shifting the former peak to a higher frequency range than the latter peak. Also, electric symmetry of the probe is maintained.