The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 1993

Filed:

Apr. 20, 1992
Applicant:
Inventors:

Kiyohito Tokuda, Tokyo, JP;

Atsushi Fukasawa, Tokyo, JP;

Satoru Shimizu, Tokyo, JP;

Yumi Takizawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L / ;
U.S. Cl.
CPC ...
395-2 ;
Abstract

Features are extracted from a sampled input signal by performing first linear predictive analyses of different first orders p on the sample values and performing second linear predictive analyses of different second orders q on the residuals of the first analyses. An optimum first order p is selected using information entropy values representing the information content of the residuals of the second linear predictive analyses. One or more optimum second orders q are selected on the basis of changes in these information entropy values. The optimum first and second orders are output as features. Further linear predictive analyses can be carried out to obtain higher-order features. Useful features are obtained even for nonstationary input signals.


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