The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 1993
Filed:
Oct. 04, 1991
Klaus Weber, Konigsbronn, DE;
Wolfgang Siersch, Munchen, DE;
Erwin Sick GmbH Optik-Elektronik, Waldkirch, DE;
Abstract
The invention relates to an optical inspection apparatus comprising an illuminating means which has a linear light source (11) and a concave cylindrical mirror (10) which forms an image of the light source (11), with the cylindrical axis of the cylindrical mirror extending essentially parallel to the light source (11) in order to generate an illuminated strip (31) on a web (12) to be monitored, with the illuminated strip preferably extending over the entire width of the web (12). By means of an optical system (24) a light receiving means forms an image of an inspection line (32) extending on the material web (12) at the center of the illuminated strip (31) on a row-like photoreceiver arrangement (25), so that light emerging from the material web (12) is detected. The photoreceiver arrangement (25) is connected to an electronic processing circuit (26). The cylindrical mirror (10) which forms an image of the linear light source (11) has circumferentially extending grooves (17) arranged alongside one another in the cylindrical surface.