The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 1993

Filed:

Feb. 20, 1992
Applicant:
Inventors:

Itaru Furukawa, Kyoto, JP;

Makoto Hirosawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358466 ; 358483 ; 358482 ; 358465 ; 358448 ; 358471 ; 35821315 ;
Abstract

An image reader utilizing a CCD line sensor (8) which involves no possibility of any stripe pattern (output irregularity) being produced with respect to dots output from the CCD line sensor (8) even if there is any characteristic error between outputs of odd n-th and even n-th elements of the CCD line sensor (8). Data of the odd n-th elements and data of the even n-th elements are supplied to an averaging circuit (52). Where the absolute value of the difference in data between odd n-th and even n-th elements is greater than a predetermined threshold value, a decision circuit outputs a select signal of H level. Where the absolute value of the difference is smaller than the threshold value, the decision circuit (56) outputs a select signal of L level. A selector (58) selects the output of each odd n-th element or even n-th element as a read output in case that the select signal is of H level. If the select signal is of L level, a mean value of the outputs of the two elements is selected as a read output. Thus, it is possible to prevent any stripe pattern occurrence due to output irregularity without detriment to the sharpness of original reading.


Find Patent Forward Citations

Loading…