The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 1993
Filed:
Nov. 16, 1992
Arthur H Carrieri, Abingdon, MD (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A system for remotely detecting liquid contaminants on surfaces, including hemical agents and their simulants is presented. The system includes a Fourier Transform Infrared Spectroradiometer aligned to optionally develop graybody photoluminescence spectra from the generation of a plurality of interferograms co-added to provide a favorable signal to noise ratio for use with and thereafter transforming the co-added interferograms. A laser is used for surface irradiating a substrate potentially having the chemical agents to heat the substrate. A shutter controls the laser to receive and record photoluminescence emissions from the heated substrate, and generate a plurality of interferograms co-added to provide a favorable signal to noise ratio for use with the Fourier Transform Infrared Spectroradiometer. The co-added interferograms are used to generate molecular absorption resonant peaks which are mathematically processed in the Fourier Transform Infrared Spectroradiometer. The acquired data is processed to match the spectrum of known chemical agent and the measured difference emissions spectrum during irradiation. If a match exists, the presence of chemical agents is confirmed. A digital filter may be used to extract the chemical agent emission band which are distinct from the emission bands of the substrate sought by the detection system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile