The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 1993
Filed:
Nov. 20, 1990
Yasuhiro Takemura, Shiroi, JP;
Toshiharu Takesue, Chiba, JP;
Sumitomo Cement Company Ltd., , JP;
Abstract
A method of obtaining a correlation between a pattern to be identified and a number of reference patterns by irradiating and displaying the pattern to be identified and the reference patterns on an optical display plane, thereby producing a complex optical amplitude distribution. This distribution is Fourier-transformed to produce a first power spectrum corresponding to the light intensity distribution of its Fourier transformation patterns. The patterns are again irradiated based upon the first power spectrum and a second Fourier transform is performed to produce a second power spectrum which is the light intensity distribution of the second Fourier transformation pattern. The area of this distribution is restricted by controlling the transmittance or the reflectance of each of the portions of the display plane.