The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 1993

Filed:

Apr. 10, 1992
Applicant:
Inventors:

Gianluca Tovini, Norwalk, CT (US);

Szee M Yao, Norwalk, CT (US);

Assignee:

Agissar Corporation, Stratford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C / ;
U.S. Cl.
CPC ...
209556 ; 209604 ; 209654 ; 271262 ;
Abstract

A unique envelope handling and sorting system is attained for efficiently and reliably separating envelopes which fail to meet pre-selected criteria from envelopes meeting these criteria by providing an envelope sensing section having at least one gauging member which comprises a plurality of separate and independent roller assemblies, each of which are securely mounted to an elongated shaft which moves arcuately in response to the thickness measuring movement of the gauging member. In the preferred embodiment, the envelope handling and sorting system of this invention also incorporates means for measuring the length of each envelope and for removing all envelopes that fail to meet the preselected length requirements. In addition, the preferred system incorporates means for effectively dividing the envelope into a plurality of separate zones and enabling the user to select any desired zone for use and evaluation of the envelope thickness measurements. In this way, any areas of the envelope, such as construction seam bearing areas, which may provide erroneous information, are specifically avoided and only the precisely desired areas are used for thickness measurements.


Find Patent Forward Citations

Tovini, Gianluca. (1993). Automated thickness and length detecting and sorting system for envelopes (U.S. Patent No. 5238123). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5238123

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…