The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 1993
Filed:
Apr. 24, 1992
Richard D Albert, Danville, CA (US);
Other;
Abstract
X-ray examination of objects, which may be very large objects such as aircraft, boat hulls or lengthy pipelines, is accomplished with an x-ray source having a moving x-ray origin point that is scanned in a raster pattern. At least one x-ray detector having a very small x-ray sensitive area is disposed behind or within the object and provides an output signal indicative of internal characteristics of an adjacent region of the object. The source and detector undergo relative travel at least in a lateral direction during the examination to provide a sequence of different x-ray views that may include views of successive regions of the object, views from different angles and stereo views. X-ray images are produced at one or more monitor screens by sweeping a point of light in a raster pattern corresponding to that of the x-ray source while modulating the intensity of the point of light in accordance with the output signal of the detector. An array of spaced apart detectors may be used to simplify examination of large objects or to speed examination of small objects.