The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 1993
Filed:
Apr. 09, 1992
Matthias Hartrumpf, Karlsruhe, DE;
Abstract
A device for measuring the positions and the diameters of the filaments in filament bundle comprising a laser scanner disposed adjacent the filament bundle wherein, in the optical path behind the filament bundle to be measured, are disposed an optical means such as a lens of mirror, as well as a filter preferably in the focal plane of said optical means for filtering out the light share not diffracted, as well as a detector and analysis means. The filter is permeable only for limited portions of the diffraction image, and the detector means measures the intensities at several locations of the diffraction image at the same time. In the analysis means the positions of the filaments are determined on the basis of the measured intensity curves while the diameters of the filaments are determined on the basis of the ratios of the measured intensities.
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