The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 1993

Filed:

Sep. 18, 1991
Applicant:
Inventors:

David L Pfeil, Winthrop, MA (US);

Robert W Foster, Foxboro, MA (US);

Carrol J Hoffman, Westwood, MA (US);

Assignee:

Thermo Jarrell Ash Corporation, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
356311 ; 356316 ; 7386481 ;
Abstract

A sample processing system for use with analysis apparatus includes tubular structure that defines a continuous elongated flow chamber. The tubular structure has an inlet port at one end, an outlet port at the other end, and a sample inlet port in communication with the continuous elongated flow chamber between the inlet and outlet ports. A first pump flows diluent at a first rate through the inlet port for flow through the continuous elongated flow chamber, and a second pump flows a liquid mixture from the continuous elongated flow chamber through the outlet port at a rate greater than the first rate. With the sample inlet port submerged in a sample to be analyzed, the sample is aspirated through the sample inlet port into the flowing diluent stream in the continuous elongated flow chamber for dilution and application of the diluted sample mixture to sample analysis apparatus for analysis.


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