The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 1993

Filed:

Jul. 18, 1991
Applicant:
Inventors:

Thomas Berghaus, Wiesbaden, DE;

Peter Klaede, Frankfurt, DE;

Assignee:

Omicron Vakuumphysik GmbH, Taunusstein, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
310328 ;
Abstract

The description relates to an adjusting device 1 for microscopic movements and comprising a carrier element 3 with, fixed on the carrier element 3, drive elements 6a, 6b, 6c which have a piezoelectric transducer which utilises the shear effect and which have a bearing element 5 which rests on the drive elements 6a, b, c. So that such an adjusting device 1, regardless of its position, is able to carry out high-precision reproducible microscopic movements, in particular also movements in a vertical direction being possible while under load, the form and disposition of drive element 6 and bearing element 5 are designed for the performance of a guided microscopic movement. In addition, a pressure applying device 8 is provided which presses the bearing element 5 and the drive element 6 against one another with a predetermined force. Preferably, the pressure applying device comprises at least one magnet 17 which attracts the bearing element 5 with an adjustable force. According to particular embodiments, guided rotary movements are also feasible with the adjusting device according to the invention.


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