The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 1993

Filed:

Apr. 24, 1991
Applicant:
Inventor:

Takahisa Hayashi, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359659 ; 359656 ; 359657 ; 359658 ;
Abstract

An objective lens system for use within a microscope includes a first to an eleventh lens which are disposed in that order from an object side to an image side with predetermined air spacings therebetween. The first lens in the form of a meniscus is made of quartz, and has a concave surface which is directed toward an object side. The second lens in the form of a meniscus is made of quartz, and has a convex surface which is directed toward the object side. Each of the third, fifth, sixth and eighth lenses is made of fluorite, and has a positive power. Each of the fourth, seventh and ninth lenses is made of quartz, and has a negative power. The tenth lens is made of either quartz or fluorite, and has a positive power. The eleventh lens in the form of a meniscus is made of quartz, and has a concave surface which is directed toward the image side. The system transmits ultraviolet and/or far ultraviolet light and corrects chromatic aberration.


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