The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1993
Filed:
Jun. 27, 1991
Martin M Fejer, Menlo Park, CA (US);
Aharon Kapitulnik, Palo Alto, CA (US);
Kenneth A Fesler, Sunnyvale, CA (US);
Board of Trustees, Leland Stanford Junior University, Stanford University, Stanford, CA (US);
Abstract
A method and apparatus for measuring nonreciprocal optical effects contemplates directing two circularly polarized optical beams having a known phase relation to each other at a sample, and detecting the difference in phase between the two beams after they have encountered the sample. In a transmission measurement the two circularly polarized beams have the same handedness, but pass through the sample in opposite directions. In a reflection measurement, the two circularly polarized beams have opposite handedness, but encounter the sample in the same direction. In a particular embodiment of the invention a linearly polarized beam is introduced into a Sagnac interferometer and split into two linearly polarized beams which are ultimately recombined.