The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 1993

Filed:

May. 18, 1992
Applicant:
Inventors:

Shusaku Shimada, Tokyo, JP;

Hiroshi Kawarabayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 364487 ;
Abstract

A waveform measuring device comprising an A/D converter for converting an input signal into a digital signal, a memory storing output data from the A/D converter, a first trigger condition detecting unit for detecting a present input signal meeting a first trigger condition, a second trigger condition detecting unit for detecting a past input signal of a desired time which is remote from the present time and meeting a second trigger condition, and a trigger signal generating unit for generating a trigger signal when the trigger conditions of the first and second trigger condition detecting units are satisfied. The waveform of the input signal corresponding to a desired interval is displayed in accordance with the trigger signal from the trigger signal generating unit. The input signal to the second trigger condition detecting unit is given without reading it out of the memory.


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Shimada, Shusaku. (1993). Waveform measuring device (U.S. Patent No. 5235269). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5235269

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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