The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1993
Filed:
Oct. 17, 1991
Michitaka Honda, Yaita, JP;
Kabushiki Kaisha Toshiba, Kanagawa, JP;
Abstract
To discriminate a contrast image from a non-contrast image, an X-ray imaging method is characterized by comprising the steps of: acquiring a plurality of X-ray images of a biological body under medical examination; subtracting at least two sets of the X-ray images with each other acquired at temporally different timings to obtain a subtraction image; subdividing one subtraction image into a plurality of image blocks; calculating an averaged value of image concentration with respect to each of the image blocks, thereby obtaining a plurality of averaged values for the subdivided image blocks; calculating a difference between at least two averaged values of image concentration with respect to the image blocks acquired within substantially same temporal timing period; and, judging whether or not the X-ray image is acquired under such a condition that an X-ray contrast medium appears therein based upon the difference in said two averaged values of image concentration.