The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 1993

Filed:

Jun. 19, 1991
Applicant:
Inventor:

Francois Baechler, Wermatswil, CH;

Assignee:

Zellweger Uster AG, Uster, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D01G / ; G01L / ;
U.S. Cl.
CPC ...
19300 ; 19-024 ; 73159 ;
Abstract

In a textile fiber preparation machine, thickness and/or unevenness characteristics of a lap (W) formed by a web or wadding of textile fibers being fed in the machine are determined for individual longitudinal strips spaced across the width of the lap. A plurality of individual sensors (2) are arranged next to one another over the width of the lap (W) and press the lap (W) against a stationary guide (4,5, 6--6'). Each of the sensors (2) is movable toward and away from the guide and is resiliently biased toward the guide. The amount of movement of an individual sensor (2) away from the guide by the lap is a measure of the thickness of the lap portion being contacted by that sensor. The use of individual sensors arranged end to end across the width of the lap improves sensitivity so that even brief changes in thickness when the lap has a high transport speed can be measured reliably. Furthermore, the apparatus can be adapted quickly and simply to changing lap widths.


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