The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 1993
Filed:
May. 15, 1991
Yasuhiko Yokomori, Yokohama, JP;
Toshiyuki Furuta, Yokohama, JP;
Naoki Ozawa, Kawasaki, JP;
Masato Ohta, Kawasaki, JP;
Hideo Suda, Yokohama, JP;
Shogo Kida, Kawasaki, JP;
Ryohei Matsumoto, Yokohama, JP;
Kunio Kurata, Matsudo, JP;
Yoshinobu Kubo, Matsudo, JP;
Yoshiharu Matsuoka, Kamagaya, JP;
Masahiro Kato, Tokyo, JP;
Suzuki Motor Corporation, Shizuoka, JP;
Dainabot Co., Ltd., Tokyo, JP;
Abstract
A method and apparatus for discriminating aggregation patterns includes detection of an image of the aggregation pattern and dividing the image into a plurality of image line data using a photoelectric element. The image line data defines an image waveform and includes a maximum image value. High and low image levels are defined based on the maximum image value. These high and low image levels are used to determine first and second areas of the aggregation pattern image, which first and second areas respectively include image values at least as large as the high and low image levels. An area difference between the first and second areas and a level difference between the high and low image levels are then calculated, along with a ratio of the area difference to the level difference. The calculated area difference and ratio are then compared with a predetermined reference value to discriminate whether or not the aggregation pattern is positive.