The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 1993
Filed:
Aug. 29, 1990
Herbert Hohner, Neu Anspach, DE;
Jurgen Kesberg, Nidderau, DE;
Nord-Micro Electronik Feinmechanik AG, Frankfurt am Main, DE;
Abstract
A method for forming an evaluation signal (YM) representing a measurement value comprises the steps of obtaining a plurality of measurement signals (X1, X2, X3, X4) from a plurality of sensors detecting measurement values within a time interval, preferably simultaneously; supplying each measurement signal (X1, X2, X3, X4) to a plurality of evaluation units; and forming an evaluation signal (YM1, YM2, YM3, YM4) in accordance with an evaluation algorithm with each evaluation unit. A circuit configuration for forming an evaluation signal (YM) in accordance with an evaluation algorithm from a plurality of measurement signals (X1, X2, X3, X4) comprises: a plurality of sensors detecting the measurement value within a time interval, preferably simultaneously, and generating the measurement signals, an evaluation unit, and, advantageously, a confirmation unit and a consolidation unit, the units forming a single aggregate unit. The plurality of evaluation units each form one evaluation signal (YM1, YM2, YM3, YM4) in accordance with the evaluation algorithm from the measurement signals (X1, X2, X3, X4).