The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 1993
Filed:
Jan. 23, 1992
Daniel R Peters, San Antonio, TX (US);
John Taboada, San Antonio, TX (US);
Other;
Abstract
A pattern ERG (PERG) projector (FIG. 2a) includes a coherent light source (32) for generating a projection beam, modulation optics (34) for modulating the projection beam with an alternating ERG interference pattern (with a selected spatial and alternation frequency), segmentation optics 35 for selectively segmenting the ERG interference pattern, and wide-angle imaging optics (36) for focusing the projection beam such that it passes through the pupil, and then diverges to project onto the entire retinal field-of-view, including the anterior retina out to the far periphery. A PERG testing program can be used to selectively probe the entire retina and develop a retinal map--PERG data has been correlated with retinal ganglion cell viability, and is therefore useful in diagnosing and monitoring retinal degeneration caused by glaucoma and other diseases.