Method for self regulating cmos digital microcircuit burn-in without

Abstract

A burn-in heating circuit for an integrated circuit including a burn-in clock generator for producing a burn-in clock signal that is provided to the clock buffer of the clock distribution system of the integrated circuit. The operating frequency of the burn-in clock is at or close to the maximum frequency that the clock distribution system can reliably sustain with valid logic levels, so that the highest possible self-heating can be achieved by power dissipation in the clock distribution system. A comparator that is responsive to a temperature signal representative of the integrated circuit junction temperature and a signal indicative of the desired burn-in temperature modulates the clock generator so that the junction temperature of the integrated circuit resulting from self heating is close to the desired burn-in temperature.