The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 1993
Filed:
May. 13, 1991
William R Pfister, Schaumburg, IL (US);
Recon/Optical, Inc., Barrington, IL (US);
Abstract
Improved apparatus and methods of image information processing are disclosed which extend the operational coverage of an image system to higher velocity to height ratio scenarios while optimizing image resolution. The invention typically is implemented by a time delay and integrate charge-coupled device. In conjunction with an image variable row scan rate, a novel method of clocking the device is used to adjust the number of cycles of clocking performed in one row read out time, and to simultaneously transfer pixel information located in a plurality of rows of an imaging array having a predetermined row relationship. The relationship between the variable row scan rate, the predetermined row relationship and the number of cycles of clocking is adjusted so that the scan rate can increase above a maximum base scan rate by a factor of (AB)/(B-1), where A is the number of cycles of clocking performed and B is an integer corresponding to the predetermined row relationship. This increased scan rate and clocking optimizes resolution in the extended operational coverage scenario at (B-1)/(AB). In some non-scanning applications, the velocity to height ratio will determine the rate of image movement across the array, and the row relationship and the number of cycles of clocking will be the chosen parameters to optimize resolution.