The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 1993

Filed:

Jan. 29, 1992
Applicant:
Inventors:

Shein S Wang, Ponca City, OK (US);

David W Bell, Ponca City, OK (US);

Assignee:

Conoco Inc., Ponca City, OK (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
364422 ; 364421 ; 367 73 ;
Abstract

A method for generating a three dimensional velocity model from a grid of two dimensional lines is presented. Each of the two dimensional lines is common offset depth migrated and the migrated common offset sections are sorted into common image point (CIP) gathers. The proposed method examines all the common image point gathers from all the two dimensional lines and extracts out of plane three dimensional information. An initial three dimensional model is constructed from the two dimensional depth sections by mapping the depth images of several reflectors from each two dimensional line. Ray tracing through this initial three dimensional model, the out of plane three dimensional information is used to compute a set of corrections to the boundaries in the three dimensional model. The three dimensional model boundaries are then iterated until all mismatches are minimized. The final model can be used for a final three dimensional depth migration, or as a three dimensional interpretation in agreement with all the two dimensional lines.


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