The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 1993

Filed:

Mar. 09, 1992
Applicant:
Inventors:

David S Reed, Truckee, CA (US);

Robert C Funk, Auburn, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356244 ; 356446 ;
Abstract

A sample holding apparatus (20) and method for use with an optical analyzing assembly (10) for irradiating a sample (33) with light energy. The sample holder apparatus (20) comprises a sample container (30) having a downwardly facing container opening (44), and a partition (32) movably positioned over the opening (44). A container support (24) is positioned adjacent the partition (32) and includes a surface (26) having an analyzing window (28) for transmitting the light energy therethrough. The container (30) is movably mounted to a transport mechanism (36) which permits the partition (32) to slidably retract from a closed position, across the opening (44), to an open position as the container (30) is urged onto the support surface (26). Consequently, the sample (33) contained in the container (30) is exposed and drawn into direct contact with the analyzing window (28). The wall members (38) of the container (30) retain the particulates of the sample (33) in substantially a same position during the relative movement.


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