The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 1993

Filed:

May. 31, 1990
Applicant:
Inventors:

Toyohiko Yoshida, Itami, JP;

Yuichi Saito, Itami, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395575 ; 395375 ; 371 161 ; 371 151 ; 3649449 ; 364D / ; 3642566 ;
Abstract

A microprocessor having a test mode wherein a test instruction including an instruction for executing a diagnosing microprogram routine which tests each function block inside of the microprocessor and an instruction which makes data scan in to various latches such as a latch at output portion of the micro ROM for easily diagnosing each internal function blocks by independently operating them, and the latch at the output portion of the micro ROM is allocated an address and is constituted to be loaded in and to store the data from outside of the microprocessor. A diagnosing instruction is loaded from the outside of the microprocessor and the microinstruction of an address allocated the latch is executed, thereby the cause of a fault in the microprocessor can be easily diagnosed.


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