The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 1993
Filed:
May. 14, 1992
Applicant:
Inventors:
Andrei Feldman, Paris, FR;
Dominique Cornuejols, Palaiseau, FR;
Assignee:
General Electric CGT SA, Issy les Moulineaux, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36441313 ; 378207 ; 2502521 ;
Abstract
A method and a system for calibrating an x-ray scanner, in which the lengths d.sub.ij of x-ray paths are first computed by means of the image of the calibration standard. There are then computed both the theoretical attenuations Ac.sub.ij and the attenuations Am.sub.ij measured on the image. There are then deduced the coefficient of proportionality K between the values Ac.sub.ij and Am.sub.ij in order to obtain values of K.times.Ac.sub.i. The values KAc.sub.i and Am.sub.i are employed for calculating the corrections to be made per channel as a function of the attenuation.