The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 1993
Filed:
Mar. 29, 1990
Hideaki Ogawa, Kamikyo, JP;
Eiichi Tamaki, Kamikyo, JP;
Takumi Yoshida, Kamikyo, JP;
Yasuyuki Wada, Kamikyo, JP;
Akira Kuwabara, Kamikyo, JP;
Dainippon Screen Mfg. Co., Ltd., Kyoto, JP;
Abstract
An optical beam scanning system for scanning photosensitive material (1) comprises a laser (201), a beam splitter (204) for producing multibeams (LB.sub.a, LB.sub.b), AOM's (207a, 207b), a multibeam adjuster (300) for turning the multibeams to intersect each other at a prescribed point (P.sub.C), a horizontal expander (211), an AOD (213), a vertical expander (214), a deflection direction adjuster (400) for rotating a deflection direction of the multibeams, and a variable focusing mechanism (500) comprising a plurality of object lenses (501-504). A pixel pitch and a spot diameter on the photosensitive material can be changed separately from each other by exchanging the object lenses and by adjusting an angle of intersection of multibeams (B.sub.a, B.sub.b) by means of the multibeam adjuster. Cylindrical lenses of the horizontal and vertical expanders are so positioned that they compensate a cylindrical lensing effect of the AOD.