The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 1993

Filed:

Sep. 09, 1991
Applicant:
Inventors:

Tapio Yrjonen, Turku, FI;

Timo Oikari, Turku, FI;

Kauko Lehtinen, Raisio, FI;

Assignee:

Wallac Oy, Turku, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ; G01T / ;
U.S. Cl.
CPC ...
250362 ; 250364 ; 250328 ;
Abstract

A method for correcting measuring values when measuring liquid scintillation samples deposited on sample plates by a photodetector which will be affected by scintillation photons from other samples in the plate in addition to the sample being measured. Said correction is done by pre-determining affection of the other samples of the plate as a function of quench level and correcting observed measuring values using this function.


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