The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 1993
Filed:
Sep. 03, 1992
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
Particle pattern images of the sample are optically measured by an image reader of a particle agglutination pattern judgment apparatus, and the measured particle pattern images are retrieved by a data processing controller to be able to execute pattern judgment processing. The data processing controller obtains predetermined parameters on the basis of the particle pattern images read by the image reader, and automatically judges an agglutination, non-agglutination, or unidentified attribute of each particle pattern on the basis of the obtained parameters. An operator visually observes the particle pattern images of the sample to visually determine an agglutination, non-agglutination, or unidentified attribute of each particle pattern of the sample. The operator inputs the visual judgment results in the particle agglutination pattern judgment apparatus using an input unit. The data processing controller changes at least one of the automatic judgment results and a threshold value according to the input visual judgment results.