The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 1993

Filed:

May. 30, 1991
Applicant:
Inventors:

Isamu Yamada, Kawasaki, JP;

Akira Shiba, Kawasaki, JP;

Shinichi Amemiya, Yokohama, JP;

Keiichi Murakami, Kawasaki, JP;

Takaki Shimura, Machida, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
12866006 ;
Abstract

An ultrasonic imaging apparatus for obtaining a two-dimensional distribution of a predetermined characteristic parameter of a medium of the ultrasound at various points in a plane. The apparatus contains a unit for designating a region of interest in said plane, and a unit for obtaining and indicating statistical information on a dispersing characteristic of said predetermined characteristic parameter of the medium at the various points in the region of interest of said plane. In addition, the apparatus contains a unit for obtaining and indicating a recent history of the dispersing characteristics during the operation of obtaining the two-dimensional distributions which are most recently carried out. Further, the apparatus contains a unit for obtaining and indicating the plane for which the minimum standard deviation is obtained, and a unit for indicating the two-dimensional distribution for the plane.


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