The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 1993
Filed:
May. 31, 1990
Denis Simeoni, Cannes, FR;
Guy Cerutti-Maori, Cannes la Bocca, FR;
Aerospatiale Societe Nationale Industrielle, Paris, FR;
Abstract
A two-channel multiplex Fourier transform spectrometry interferometer device comprises two semi-reflecting mirrors substantially in alignment with each other between two reflecting surfaces substantially parallel to each other and to a mean plane containing the semi-reflecting mirrors. At least one of the mirrors and surfaces is inclined by a non-zero amount to the mean plane. The algebraic sum of the inclinations of the semi-reflecting mirrors relative to the mean plane is different than the sum of the inclinations of the reflective surfaces relative to said plane. At least one prismatic blade means with an index of refraction different than that of the remainder of the interferometer device is disposed between one of the semi-reflecting mirror and one of the reflective surfaces. The algebraic differences of the prismatic blade angles are different to either side of the mean plane. For earth spectrometry the device is mounted on an aircraft or a satellite, for example, moving relative to the earth.