The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 1993

Filed:

Oct. 31, 1990
Applicant:
Inventors:

Wayne C McGinnis, San Diego, CA (US);

Thomas E Jones, Spring Valley, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01B / ; G01N / ; G01R / ;
U.S. Cl.
CPC ...
324713 ; 324 716 ; 505-1 ; 505843 ;
Abstract

The present invention provides a method for measuring the intragranular and ntergranular critical current of a granular superconductive material, comprising the steps of: 1) conducting a substantially rectangular electronic pulse through the material so as to conduct a current through the material such that when the intergranular critical current of the material is exceeded, any grains present in the material remain in a superconducting state when the current level is below the intragranular critical current; 2) measuring the current through the material while conducting the pulse; 3) measuring a voltage difference across the material while conducting the pulse; 4) determining the intergranular critical current through the material by discerning a non-zero voltage difference across the material and contemporaneously measuring the current; and 5) determining the intragranular critical current through the material by varying the current to discern a current level at which the electrical resistance of the material increases to that of the non-superconducting state as the grains of the material transition from the superconducting to a non-superconducting state. This method may also be used to determine the critical current of a homogeneous superconductive material.


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