The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 1993
Filed:
Sep. 20, 1991
James L Taylor, Naperville, IL (US);
Amoco Corporation, Chicago, IL (US);
Abstract
A process is provided for obtaining spectral information and quantifying the physical properties of a sample. The process comprises launching polychromatic light having a wavelength ranging from about 100 nanometers to about 2500 nanometers alternately through at least one sample channel and at least one reference channel, through at least one high-efficiency fiber optic switch. The sample and the polychromatic light along the sample channel are directed to a sample cell wherein the polychromatic light is passed through the sample, producing sample spectral information. The polychromatic light directed along the reference channel produces reference spectral information. The sample and reference spectral information is reproducibly and uniformly imaged by passing or conveying said sample and reference spectral information through a mode scrambler and the uniformly imaged sample and reference spectral information is then processed in a wavelength discrimination device wherein the uniformly imaged spectral information is separated into component wavelengths and the light intensity at each wavelength determined and recorded. A chemometric model and the separated and recorded uniformly imaged sample and reference spectral information are then utilized to predict the physical properties of the sample. The process of the present invention provides improved prediction accuracy, increased reliability, lower operating costs, and is easier to use and calibrate.