The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 1993
Filed:
Jun. 06, 1989
Naruto Takasaki, Kawasaki, JP;
Yutaka Tanaka, Yokohama, JP;
Hitachi Software Engineering Co., Ltd., Yokohama, JP;
Abstract
A pattern recognition apparatus is capable of subjecting a large image region to image processing with an image memory having a small memory capacity and providing a contouring line data of an image in the same manner as processing with an image memory having a large memory capacity. The pattern recognition apparatus is provided with an image input means for inputting an image; an image data storing means for storing image data; a contouring line data storing means for storing contouring line data; and a contouring line data connecting means. The contouring line data connecting means is to partition image data into adjacent partitioned regions so as to allow them to overlap with each other by only one pixel, to delete a contouring line data in an overlapping portion of the adjacent partitioned regions from a contouring line data for the image data in each of the partitioned regions on the basis of a vector data passing in a predetermined direction, and to connect the contouring line data of an open drawing so as to match their terminal points in the overlapping portion thereof with each other, thereby providing a total contouring line data.