The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 1993
Filed:
Dec. 28, 1990
Eldon E Eller, Laguna Hills, CA (US);
Endevco Corporation, San Juan Capistrano, CA (US);
Abstract
A method and apparatus for self-testing a transducer system. A signal generator is used to generate a predetermined sequence of signals or pulses, and the sequence has a finite test-time duration. The self-test signal also has the properties that its time varying part: (1) sums to zero over the test time interval; and (2) it has a relatively flat frequency spectrum. Additionally, calculations are made even simpler if the self-test signal is chosen to switch at pseudo random intervals between two fixed values. The output of the self-test system has one term which is directly proportional to the transducer system sensitivity and represents the desired self-test result, and one or more error terms which tend toward zero as the test-time duration increases. The self-testing system of the present invention may be implemented either in analog circuitry, digital logic, or a combination thereof. Preferably the transducer system is operatively disposed on an integrated circuit chip, and self-testing system of the present invention is similarly situated on the same integrated circuit chip.