The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 1993
Filed:
Nov. 22, 1991
Motohiro Yamane, Tokyo, JP;
Takashi Shigematsu, Tokyo, JP;
The Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
A method for measuring the dimension of an optical connector, consisting of a step wherein an inspection ferrule provided with a single optical fiber is inserted in each pin hole in the sample ferrule and an optical fiber or fibers are inserted in the fiber inserting hole or holes, a step wherein the sample ferrule is located on a position measuring apparatus on the X or Y axis, a step wherein a light transmitting and receiving ferrule provided with a light transmitting and receiving fiber, which is installed on a Z-axis stage, is butted against the sample ferrule with a specific distance, a step wherein the sample ferrule is moved in the direction of the axis X or Y by the position measuring apparatus, thereby optically connecting the single optical fiber or one of the optical fibers to the light transmitting and receiving fiber, a step wherein the sample ferrule is moved in the direction of the axis X or Y by the position measuring apparatus and the light transmitting and receiving fiber is switched to the single optical fiber or other optical fiber, thereby measuring the position of each optical fiber of the sample ferrule and the inspection ferrules, and a step wherein the position of the center of each fiber inserting hole based on the pin holes of the sample ferrule is determined from the measurement results.