The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 1993

Filed:

Apr. 16, 1992
Applicant:
Inventors:

Joseph R Adamski, Sudbury, MA (US);

J Scott Petty, Hanover, MA (US);

William E Nothe, Billerica, MA (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250339 ; 250341 ; 250353 ;
Abstract

Method and apparatus for determining moisture content of materials by irradiating a sample of unknown moisture content with a narrow frequency band of light at a first wavelength during a first time period and a narrow frequency band of light of a second wavelength during a second time period. The two wavelengths of light have different water absorptive characteristics, and therefore are reflected by varying degrees depending on the surface moisture on the material. The respective reflections are measured by a single common detector, and a value corresponding to the ambient light is subtracted from each measurement. A ratio of the resultant values is then correlated with data derived from precalibration measurements of samples of known moisture content.


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