The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 1993
Filed:
Mar. 06, 1989
Pedro Potocnjak, Bartolo Soto, CL;
Fidel Zavala, New York, NY (US);
Ruth S Nussenzweig, New York, NY (US);
Victor Nussenzweig, New York, NY (US);
New York University, New York, NY (US);
Abstract
The present invention provides an immunoassay of general applicability. The assay detects an antigen by its inhibition of the reaction between the combining site of two antibodies. One of the antibodies binds antigen, and the second antibody binds to the combining site or idiotype of the first antibody. It is preferable that both the antibody that binds the antigen and the anti-idiotypic antibody are monoclonal antibodies. The assay provides a method for measuring concentrations of single epitopes without requiring purified antigen, and it is particularly useful for measuring the quantity of any nonpurified antigen present in low concentration in a mixture of antigens. The use of monoclonal antibodies as reagents is advantageous in providing an essentially unlimited supply of highly specific and standardized reagents, without the batch-to-batch variation encountered when using conventional polyclonal antibodies. The invention further provides a screening method for isolating the appropriate monoclonal antibodies of anti-idiotypic specificity.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile