The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 1993

Filed:

Jul. 05, 1991
Applicant:
Inventor:

Robert Heidsieck, Versailles, FR;

Assignee:

General Electric CGR S.A., Issy les Moulineaux, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378 97 ; 378 95 ; 378108 ; 378207 ;
Abstract

The disclosure concerns radiology instruments that include an X-ray source, a receiver of the film or film-screen type, a detection cell and means to compute the yield at the cell. The method consists of performing measurements of the yield at instants t.sub.1, t.sub.2, . . . t.sub.3 during the exposure, so as to determine the lumination or luminous exposure (the quantity of the light received multiplied by the exposure time) on the film and then computing the lumination remaining to be acquired to obtain the chosen optical density on the film.


Find Patent Forward Citations

Heidsieck, Robert. (1993). Method for the automatic determination of the exposure time of a (U.S. Patent No. 5218625). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5218625

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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