The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 1993
Filed:
Jan. 17, 1990
Yves Trousset, Paris, FR;
Didier S Felix, Boulogne, FR;
Anne Rougee, Fontenay aux Roses, FR;
Kenneth Hanson, Los Alamos, NM (US);
General Electric CGR S.A., Issy les Moulineaux, FR;
Abstract
In order to carry out a three-dimensional reconstruction of an object acquired by a series of conical projections on a two-dimensional multidetector, the object is estimated by a sampled function. The sampled function is projected and the projections of the sampled function are compared with the measurements resulting from acquisition on the 2D multidetector. A new estimation of the object is deduced therefrom and these operations are repeated until the comparison is satisfactory. In order to project, the sampled three-dimensional object is decomposed on a space of Gaussian basis functions. The contribution of the basis functions is computed for each image of the projection images, these contributions being equal to the integral of the product of the basis functions and of a support for illumination of the image element. It is shown that the choice of a Gaussian function as a function which is representative of the support makes it possible on the one hand to eliminate reconstruction artifacts and on the other hand to increase the speed of computation of reconstruction as a result of simplification of the reconstruction computations which this choice entails.