The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 1993

Filed:

Feb. 08, 1991
Applicant:
Inventors:

Shinichi Amasaki, Aichi, JP;

Hiroyuki Hayashi, Aichi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G05B / ;
U.S. Cl.
CPC ...
364140 ; 364184 ; 364D / ; 364221 ; 3642664 ; 36426791 ; 364D / ; 3649269 ; 364949 ; 371 165 ; 371 291 ; 395275 ; 395575 ;
Abstract

A method and apparatus for debugging a sequence program by partially running the program by a programmable controller. The programmable controller includes memory to store the sequence program and memory to store partial run conditions comprising identity of a external device required for a partial run of the sequence program, a device access method and relevant data. An external i/o device interfaces with the programmable controller to store the partial run condition. The programmable controller includes a compare circuit for comparing the stored partial run conditions and the status of the program during a partial run. The comparison circuit outputs a signal which stops the run when the result of the sequence program operation is identical with the stored partial run conditions. The stop step and number of scans of the sequence program at the time the match is identified can be output for example, on a display.


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