The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 1993
Filed:
Feb. 07, 1992
Subhash L Shinde, Croton-on-Hudson, NY (US);
Thomas K Worthington, New York, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed are apparatus and method for measuring a characteristic of a film comprised of a material that is a superconductor below a critical temperature. The apparatus includes a magnetic circuit for inducing an alternating magnetic flux at a localized region of a surface of the film. The circuit includes a magnetic core (42) having a gap (44) made therein and a drive winding (46) coupled thereto. A current source (50) is coupled to the drive winding for passing an alternating current therethrough for inducing an alternating magnetic flux within the gap. Measurement circuitry (54, 56) is responsive to a current induced within the film by an entry of the magnetic flux into the film. A processor (60) is coupled to the measurement circuitry and determines a critical current density of the superconducting film within the localized region. The measurement circuitry includes a sense winding (48) that is coupled to the core and detects a magnitude of an electrical signal induced in the sense winding by the alternating magnetic flux.