The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 1993
Filed:
Apr. 03, 1991
Applicant:
Inventor:
Kiyoshi Tsuboi, Tokyo, JP;
Assignee:
Honda Giken Kogyo Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73579 ; 73646 ; 364508 ;
Abstract
A test object having a plurality of protrusions is inspected for a defect and/or different-hardness by applying vibration to the test object. Spectral data of the vibration of the test object is analyzed based on signals indicative of the vibration of the protrusions. Spectral energy peaks are then detected in different spectral frequency regions corresponding respectively to the protrusions based on the signals. It is then determined whether there are two separate spectral energy peaks in the spectral region corresponding to each of the protrusions, thereby to determining whether there is a defect and/or different-hardness portion in each of the protrusions.