The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1993
Filed:
Jul. 15, 1991
Applicant:
Inventors:
Michael J Krummey, Madison, WI (US);
Richard J Lee, Murrysville, PA (US);
James E Nesbitt, Pittsburgh, PA (US);
William J Powers, Jr, Pittsburgh, PA (US);
Alfred J Schwoeble, Monroeville, PA (US);
Assignee:
RJ Lee Group, Inc., Monroeville, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358 93 ;
Abstract
Method of making an examination of a specimen by use of a microscope comprises during a first session, conducting a microscopic examination of a specimen by manipulation of the specimen stage while video recording the examination and during a subsequent session, replaying the recording to produce a video image, and manipulating the stage with reference to the video image so that the image observed by use of the microscope is substantially the same as the video image.