The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1993
Filed:
Dec. 20, 1991
David Sullerot, Paris, FR;
Michel Faure, Paris, FR;
Bernard Floch, Chaumont en Vexin, FR;
Yves Lumineau, Eragny S/Oise, FR;
Alcatel Fibres Optiques, Bezons Cedex, FR;
Abstract
Apparatus for detecting irregularities in the diameter of a filament has a small light source placed at the focus of an objective lens system. A horizontal slot constitutes a diaphragm for the objective lens system. A first optical system forms an image of the slot in a plane in which the filament runs past. Detectors detect the beam intercepted by the filament. An optical splitting system (P1) is interposed in the path of the beam (A), downstream of the slot (3) and upstream of the filament (5). The system is designed to form two sharp images (3', 3') of the slot (3) in a plane (4). The detectors are two oppositely-connected detectors (D1, D2) each receiving a respective beam (C, C') intercepted by the filament (5).