The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1993
Filed:
Feb. 19, 1992
Atsumi Kaneko, Tokyo, JP;
Yukio Eda, Tokyo, JP;
Asahi Kogaku Kogyo K.K., Tokyo, JP;
Abstract
A surveying instrument comprising optical system means having an optical axis to be coincided with an object to be observed, positional deviation detecting means for detecting the deviation of said optical axis with respect to the object and either means for displaying the detection result of said positional deviation detecting means or means for driving said optical system according to the detection results of said positional deviation detecting means so as to bring said axis in coincidence with the object. According to the present invention, an observer can achieve surveying operation over watching the display, and thus easy and accurate operation is possible.