The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1993
Filed:
Sep. 28, 1992
Hideki Wakamatsu, Hachiojishi, JP;
Shinya Goto, Hachiojishi, JP;
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A circuit element measuring apparatus for measuring a parameter of a device under test (DUT) includes a signal source, a voltmeter, a zero detection amplifier, and a compensation network all of which are coupled to the DUT by four shielded lines. The compensation network is also coupled to a range resistance. The compensation network provides two independent sets of correction data. One is based on the length of the shielded line and the other is based on the range resistance used. The parameter being measured can then be adjusted by the appropriate set of correction data to provide a more accurate measurement. A method of operating the circuit element measuring apparatus for measuring the parameter of the DUT by generating the two sets of correction data and adjusting the parameter accordingly.