The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 1993

Filed:

Jul. 05, 1991
Applicant:
Inventors:

Yasuo Esaki, Aichi, JP;

Kyoko Yokokawa, Aichi, JP;

Toshimi Araga, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
250339 ; 250341 ; 250347 ; 2503591 ; 2503601 ; 356244 ;
Abstract

The accessary for attenuated total reflection infrared spectroscopy comprises a condenser mirror, a crystalline element, a sample-supporting portion holding the crystalline element, an objective mirror, and a slit. The crystalline element has an incident surface, a totally reflecting surface, and an exit surface. A sample to be investigated is contacted with the totally reflecting surface The focused point of the infrared radiation from the condenser mirror is at the point of measurement on the totally reflecting surface of the crystalline element The focus of the objective mirror can be brought to the point of measurement on the sample surface. A point analysis, line analysis, or area surface on the order of 10 .mu.m can be made while observing the sample with the naked eye with the objective mirror. The invention further includes improvements in the mechanism for automatically adjusting the focus of the objective mirror when the measurement point is changed. Another improvement is that the crystalline element has the reflecting surfaces oriented individually so that the optical axis of the incident radiation rays can agree with the optical axis of the outgoing radiation rays. A further improvement is that a scale for determining a measurement point is engraved on the totally reflecting surface of the crystalline element.


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