The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 1993

Filed:

Jan. 15, 1992
Applicant:
Inventor:

Francois Blais, Orleans, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
2502032 ; 2502031 ;
Abstract

An optical system for tracking a target scans an optical beam across the target in a Lissajous pattern. The pattern has at least one portion that extends across the target. Return signals reflected from the target are used to calculate the range (and, if desired, also the intensity) of each measured point on the target (and beyond the target if some portions of the pattern miss the target), and to calculate the deviation of a reference location on the pattern, e.g. its center, from a selected location of the target. This deviation is used to correct the scan to move the reference location on the pattern towards the selected location on the target, thus tracking the target. The amplitude of the pattern can be changed to adjust the pattern on the target or to search for a target. By virtue of the range data obtainable for points on the target and on edges of the target, the system can also determine other features, such as the shape, profile, identity and attitude of the target.


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