The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 1993

Filed:

Nov. 01, 1991
Applicant:
Inventors:

Alberto Gutierrez, Jr, Fort Collins, CO (US);

Christopher Koerner, Longmont, CO (US);

Masaharu Goto, Hanno, JP;

James O Barnes, Fort Collins, CO (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K / ;
U.S. Cl.
CPC ...
377 20 ; 307597 ; 307269 ; 307603 ;
Abstract

The present invention is a time vernier providing fine timing control of an input signal having coarse timing edges. The time vernier comprises a receiving means for receiving a value representing a desired time delay to be added to the coarse timing edge input. The desired time delay may have both fine and coarse delay aspects. The time vernier also comprises a first decoding means for decoding the fine delay aspect and generating fine delay control signals, as well as a second decoding means for decoding a coarse delay aspect and generating coarse delay control signals. A delay line is also included in the time vernier which has inputs to receive the input signal having coarse timing edges, the fine and coarse delay control signals, and a control voltage which automatically adjusts with temperature and power supply variations, so as to provide for temperature and power supply compensation. The delay line combines the fine and coarse delay signals to provide an output signal with fine timing edges. Furthermore, the architecture of the present invention enables an automated method of calibration in order to adjust fine and coarse delay elements for fabrication process variations and photolithography variations.


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