The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 1993

Filed:

Nov. 07, 1991
Applicant:
Inventors:

Jun Ozawa, Hitachi, JP;

Fumihiro Endo, Hitachi, JP;

Youichi Ohshita, Hitachi, JP;

Izumi Yamada, Ibaraki, JP;

Tokio Yamagiwa, Hitachi, JP;

Hiroshi Yamada, Hitachi, JP;

Mitsuo Sawairi, Hitachi, JP;

Hashime Nagai, Kitaibaraki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
36455101 ; 324536 ; 324544 ; 340644 ; 340647 ;
Abstract

An abnormality diagnosing system and method for high voltage power apparatus wherein a plurality of detectors for detecting abnormalities of the high voltage power apparatus and providing outputs indicative thereof are disposed to detect predetermined phenomena indicative of at least an insulation abnormality, power supply abnormality, and foreign matter among abnormalities existing inside of the high voltage power apparatus. A monitoring arrangement responsive to the outputs of the detectors provides at least one of an output and display of the kind of abnormality detected.


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